Yervant Zorian

The third Lecture of IEEE overlaps:

Yield & Robustness in Today’s Advanced Technology Nodes

Yervant Zorian, Fellow & Chief Architect, Synopsys

18.3.2016 at 11:00 a.m. in T9:155 (New Building of FIT CTU in Prague)


With the wide adoption of nanometer technologies, it has become crucial for today’s SOCs to use advanced yield and robustness optimization solutions. These solutions provide comprehensive detection and repair of not only random defects, but also systematic and process variation defects often manifested under unique test corners. Moreover, with the adoption of FinFET technologies, these advanced solutions are extended to cover new FinFET specific defects. This keynote, besides discussing the key trends and challenges of advanced nanometer technologies, will cover solutions to handle the wide range of potential defectivity in today’s SOCs. It will also address post-silicon analysis and yield optimization trade-offs using volume diagnostic, failure coordinate calculation, reconfiguration and repair. With the proliferation of high-density packaging, such as 2.5D and 3D-ICs, this keynote will also cover robustness of dies and interconnects, via advanced test solutions based on IEEE test access standards.


Dr. Zorian is a Fellow and Chief Architect at Synopsys, Mountain View, California. Formerly, he was Distinguished Member of Technical Staff AT&T Bell Laboratories, Vice President and Chief Scientist of Virage Logic and Chief Technologist at LogicVision Inc. He received an MS degree in Computer Engineering from University of Southern California, a PhD in Electrical Engineering from McGill University, and an MBA from Wharton School of Business, University of Pennsylvania.

He is currently the President of IEEE Test Technology Technical Council (TTTC), the Past General Chair of the Design Automation Conference (DAC), the Editor-in-Chief Emeritus of Design & Test of Computers, the founder & chair of IEEE 1500 Standardization Working Group, and an Adjunct Professor at University of British Columbia. He served on the Board of Governors of Computer Society and CEDA, and as the Vice President of IEEE Computer Society. He has been founder and chair of a number of workshops and symposia, including the IEEE Workshops on 3D-IC Testing, Design-for-Manufacturability & Yield, Latin American Test Workshop, and East-West Design & Test Symposium.

Dr. Zorian holds 32 US patents, authored 4 books, published over 300 refereed papers and received numerous best paper awards. A Fellow of the IEEE since 1999, Dr. Zorian was the 2005 recipient of the prestigious Industrial Pioneer Award for his contribution to BIST, and the 2006 recipient of the IEEE Hans Karlsson Award for diplomacy. He is a member of the Academy of Sciences of Armenia. He received the IEEE Distinguished Services Award for leading the Test Technology Technical Council (TTTC).

This lecture is coorganized by: FIT CTU in Prague

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